Onto Innovation Inc.

Description

Nanometrics Incorporated provides process control metrology and inspection systems for use primarily in the fabrication of semiconductors and other solid-state devices worldwide. It offers automated metrology systems that provide optical critical dimension, thin film metrology, and wafer stress for transistor and interconnect metrology applications; and integrated metrology systems that are installed onto wafer processing equipment to provide near real-time measurements. The company's materials characterization products include systems that are used to monitor the physical, optical, electrical, and material characteristics of discrete electronic industry, opto-electronic, high brightness LEDs, solar photovoltaics, compound semiconductor, strained silicon, and silicon-on-insulator devices, including composition, crystal structure, layer thickness, dopant concentration, contamination, and electron mobility. Nanometrics Incorporated was founded in 1975 and is headquartered in Milpitas, California.